Compare direction
Align an edge, crack, fibre or other feature with a defined angular graduation.
Optical angle scales for microscopy, calibration, inspection and directional measurement, configured to the instrument and drawing.
A protractor reticle places angular graduations, reference marks and a defined centre inside the field of view of a compatible optical instrument.
Use it to compare orientation, included angles and directional features in microscopes, eyepieces, collimators and inspection systems. The drawing can define the angular range, graduation interval, line width, substrate and mounting geometry.

The reticle gives the instrument a visible angular reference. It does not replace calibration of the complete measuring system, so the pattern and optical setup need to be specified together.
Align an edge, crack, fibre or other feature with a defined angular graduation.
Use a centre point or crosshair to relate the measured feature to the graduation circle.
Set diameter, thickness, field of view and viewing plane around the microscope or optical assembly.
Representative customization parameters for a custom optical angle reticle. Final values follow the approved drawing and the optical system requirements.
| Parameter | Typical specification |
|---|---|
| Product name | Protractor reticle |
| Substrate | Optical glass, K9-type glass, fused silica or another specified optical substrate |
| Shape | Circular by default; other layouts subject to design review |
| Outer diameter | Defined by the eyepiece, optical system and mounting arrangement |
| Thickness | Defined by the mounting structure |
| Angular range | 0°–180°, 0°–360°, ±90° or another specified range |
| Minimum division | 1°, 0.5°, 0.1°, 30′, 10′ or another feasible interval |
| Pattern type | Angular graduations, crosshairs, concentric circles, reference lines or combined patterns |
| Graduation line width | Matched to magnification, resolution and viewing conditions |
| Centering and concentricity | Controlled against the agreed measurement and inspection requirements |
| Graduation accuracy | Defined by application, measurement grade and acceptance criteria |
| Surface processing | Chromium or other thin-film patterning; optional coatings as required |
| Applicable spectral range | Visible light or other wavelength range evaluated with the selected substrate and coating |
| Reference marks | Zero reference, centre point, crosshair, labels or custom positioning marks |
Technical note. These are representative design options, not a universal standard. Graduation pitch, pattern diameter, line width, centering tolerance and graduation accuracy depend on the optical system and agreed drawing. Graduation interval, graduation accuracy and complete-instrument angular accuracy are separate properties.
Native HTML structure and specification tables keep the component definition searchable and readable on desktop and mobile.
| Component | Description |
|---|---|
| Optical substrate | A transparent optical glass substrate such as K9-type glass or fused silica, selected for the required transmission, dimensions, thermal behaviour and mounting arrangement. |
| Graduation pattern layer | Circular or arc-shaped angular graduations, a zero reference, major and minor lines, degree labels and other positioning marks defined by the drawing. |
| Centre positioning region | A centre point, crosshair or related datum that establishes the geometric relationship between the target and the angular scale. |
| Patterned surface and coating | A chromium or other suitable thin-film pattern for dark lines, with bright-line or antireflection options evaluated when the optical system requires them. |
Align the measured edge or axis with a selected graduation. Read the relative orientation from the zero direction after confirming the reticle and target are in the intended viewing geometry.
Uniform magnification preserves an in-plane angle, while tilt, unequal X/Y scaling, image rotation and optical distortion can change the projected result.

Pattern hierarchy, centering and substrate selection should be decided from the viewing task and the instrument geometry.
Specify the interval, angular range, numbering direction and zero datum around the optical centre.
Use different line lengths, major divisions and labels so the scale remains readable at the working magnification.
Define the centre point, crosshair and graduation-circle relationship when angular readings depend on a shared datum.
Select optical glass, K9-type glass, fused silica or another suitable substrate, then confirm line polarity and coating needs.
Set diameter, thickness, clear aperture and pattern position around the actual eyepiece, collimator or measuring instrument.
Choose the angular range and pattern density around the target feature, field of view and reading method rather than selecting by diameter alone.
Compare crack, fibre, crystal, grain or fine-feature orientation within a calibrated microscope field.
Support angular comparison and alignment checks in a defined inspection instrument or assembly process.
Evaluate angles between machined edges, slots, holes and directional defects with a toolmakers microscope or vision system.
Provide a directional reference in a specialised instrument whose field, range and mounting are defined in advance.
Use the angular pattern for relative-angle comparison, directional alignment and selected optical test procedures.
Measure crack propagation, fibre orientation, crystal direction and angles between microstructures.
Share the application and drawing first, then confirm the parameters that affect pattern readability, optical fit and acceptance.
Share the optical application and technical drawing.
Confirm substrate, diameter, thickness and installation constraints.
Define angular range, division interval, line width, labels and reference marks.
Review centering, concentricity, graduation accuracy and inspection criteria.
Confirm the quotation specification and production artwork.
Angular divisions for orientation comparison.
Angular graduation reference around a defined centre.
Short answers for selecting, specifying and using an optical protractor reticle.
A protractor reticle is an optical graduation component with angular markings, usually arranged in a circular or arc-shaped pattern, for measurement, alignment and inspection in compatible optical instruments.
A protractor reticle emphasizes angular graduations and orientation references. A linear reticle uses straight graduations or coordinates to assess length and position.
Possible designs include 0°–180°, 0°–360°, ±90° or another specified sector. The feasible range depends on the pattern area and optical system.
Yes. Options may include 1°, 0.5°, 0.1°, 30′, 10′ or another specified interval, subject to geometry and manufacturing feasibility.
Yes. Angular graduations can be combined with crosshairs, centre marks, concentric circles, reference lines and numerical labels according to the drawing.
No. Graduation interval and measurement accuracy are different. Accuracy also depends on graduation error, optical alignment, the instrument configuration, reading method and calibration.
Provide the optical system, substrate, diameter, thickness, angular range, graduation interval, line width, pattern drawing, accuracy requirements, quantity and inspection requirements.
Keep these items at the end of the page so the customer can first understand the product and its use.
Inspect graduation angles relative to the zero datum, line width, centre alignment, concentricity, labels and pattern position against the agreed drawing.
Share the drawing, reference artwork or preliminary specification for a technical review.
Request a QuoteProtractor reticles use radial lines and angular graduations as references for direction and included angles.
Define the angular range, smallest graduation, numbering direction and centre location relative to the instrument mount.
Angular range, division spacing, zero direction, labels, centre and substrate dimensions.
The workpiece and scale must share the intended viewing geometry, centre and zero direction. Interpret the reading in the instrument configuration.